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Development of a testing methodology to predict optical disk life expectancy values / Fernando L. Podio.
- Format:
- Book
- Government document
- Author/Creator:
- Podio, Fernando L., author.
- Series:
- NIST special publication ; 500-200.
- NIST special publication ; 500-200
- Language:
- English
- Genre:
- Technical reports.
- Physical Description:
- 1 online resource.
- Place of Publication:
- Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1991.
- System Details:
- text file
- Notes:
- 1991.
- Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
- Title from PDF title page.
- Includes bibliographical references.
- OCLC:
- 927169936
- Publisher Number:
- GOVPUB-C13-840dcf81335fed09ded73ba8ded559c0
- Access Restriction:
- Open Access Unrestricted online access
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