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Interlaboratory study on linewidth measurements for antireflective chromium photomasks / John M. Jerke, M. Carroll Croarkin, Ruth N. Varner.

National Institute of Standards and Technology (NIST) Publications Available online

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Format:
Book
Government document
Author/Creator:
Jerke, John M., author.
Contributor:
Croarkin, M. Carroll.
Jerke, John M.
Varner, Ruth N.
United States. National Bureau of Standards.
Series:
NBS special publication ; 400-74.
NBS special publication ; 400-74
Language:
English
Genre:
Technical reports.
Physical Description:
1 online resource.
Place of Publication:
Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 1982.
System Details:
text file
Notes:
1982.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Includes bibliographical references.
OCLC:
927169558
Publisher Number:
GOVPUB-C13-030182d2a321d023d36c20ba7cdecd97
Access Restriction:
Open Access Unrestricted online access

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