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Machine vision applications in industrial inspection XII : 21-22 January, 2004, San Jose, California, USA
- Format:
- Book
- Series:
- SPIE Machine vision applications in industrial inspection XII
- Language:
- English
- Subjects (All):
- Engineering inspection--Automation--Congresses.
- Engineering inspection.
- Computer vision--Industrial applications--Congresses.
- Computer vision.
- Quality control--Optical methods--Automation--Congresses.
- Quality control.
- Measurement--Congresses.
- Measurement.
- Place of Publication:
- [Place of publication not identified] SPIE 2004
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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