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Optical constants of materials for UV to x-ray wavelengths : optival science and technology, the SPIE 49th annual meeting : 2-6 August 2004, Denver, Colorado, United States / editors, Regina Soufli, John F. Seely ; sponsored by SPIE.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Symposium on Optical Science and Technology (2004 : Denver, Colo.)
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 5538.
- Proceedings of SPIE ; Volume 5538
- Language:
- English
- Subjects (All):
- Thin films--Optical properties--Congresses.
- Thin films.
- Optical constants--Congresses.
- Optical constants.
- Physical Description:
- 1 online resource (172 pages).
- Other Title:
- Optical constants of materials for ultraviolet to x-ray wavelengths
- Place of Publication:
- Bellingham, Washington : SPIE, 2004.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 24, 2018).
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