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Two- and three-dimensional vision systems for inspection, control, and metrology II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA
- Format:
- Book
- Series:
- SPIE proceedings series Two- and three-dimensional vision systems for inspection, control, and metrology II
- Language:
- English
- Subjects (All):
- Computer vision--Optical methods--Congresses.
- Computer vision.
- Imaging systems--Congresses.
- Imaging systems.
- Three-dimensional display systems--Congresses.
- Three-dimensional display systems.
- Quality control--Congresses.
- Quality control.
- Optical measurements--Congresses.
- Optical measurements.
- Metrology--Congresses.
- Metrology.
- Place of Publication:
- [Place of publication not identified] SPIE 2004
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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