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Prototyping micro- and nano-optics with focused ion beam lithography / by Kahraman Keskinbora.

SPIE Digital Library eBooks Available online

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Format:
Book
Author/Creator:
Keskinbora, Kahraman, author.
Contributor:
Society of Photo-Optical Instrumentation Engineers, publisher.
Series:
SPIE spotlight ; SL48.
SPIE digital library
SPIE. Spotlight ; SL48
Language:
English
Subjects (All):
Ion beam lithography.
Focused ion beams.
Prototypes, Engineering.
Integrated circuits--Design and construction.
Integrated circuits.
Genre:
Electronic books.
Physical Description:
1 online resource (vi, 41 pages).
Place of Publication:
Bellingham, Washington : SPIE, 2019.
System Details:
Mode of access: World Wide Web.
text file
Summary:
This SPIE Spotlight focuses on the micro-/nano-structuring aspects of focused ion beam (FIB) instrumentation. It is designed as a tutorial with examples of real structures of increasing complexity. Readers with no previous experience with FIB/SEM instrumentation can quickly grasp the basics of ion/matter interactions, surface modification methods, initial alignment and structuring, fabrication of various micro-optic elements, and an outlook of up-and-coming FIB technologies.
Contents:
Preface
1. Introduction: 1.1. FIB source and column overview; 1.2. Ion / matter interactions; 1.3. Ion-beam spot size as a function of energy and current; 1.4. Patterning parameters and dosage; 1.5. Direct-write ion beam lithography; 1.6. Instrumentation; 1.7. Milling strategy and structural quality
2. Micro-/nano-optics prototyping case studies: 2.1. Optimization of grating fabrication; 2.2. Fresnel zone plates' 2.3. Grayscale IBL: micro-Fresnel lenses and kinoforms
3. Outlook: 3.1. Plasma FIBs; 3.2. Dedicated IBL systems with multi-ion species; 3.3. Helium ion microscope
4. Summary and conclusions
Acknowledgments
References.
Notes:
"SPIE Digital Library."--Website.
Includes bibliographical references.
Title from PDF title page (SPIE eBooks Website, viewed 2019-05-03).
ISBN:
9781510628137
OCLC:
1100834495
Access Restriction:
Restricted for use by site license.

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