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RGB interferometry for optical metrology / by Paul Kumar Upputuri, Nandigana Krishna Mohan, and Mahendra Prasad Kothiyal.

SPIE Digital Library eBooks Available online

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Format:
Book
Author/Creator:
Upputuri, Paul Kumar, author.
Mohan, Nandigana Krishna, author.
Kothiyal, Mahendra P., 1949- author.
Contributor:
Society of Photo-Optical Instrumentation Engineers, publisher.
Series:
SPIE spotlight ; SL55.
SPIE digital library
SPIE. Spotlight ; SL55
Language:
English
Subjects (All):
Interferometry.
Optical measurements.
Genre:
Electronic books.
Physical Description:
1 online resource (vi, 51 pages).
Place of Publication:
Bellingham, Washington : SPIE, 2019.
System Details:
Mode of access: World Wide Web.
text file
Summary:
This Spotlight discusses the theoretical and experimental aspects of RGB interferometry. It also focuses on various advanced RGB interferometers and their applications for 3-D surface profiling, deformation measurements, non-destructive testing (NDT), refractive index profiling of biological cells/tissues, et cetera RGB interferometry is a fast, simple, and cost-effective tool for optical metrology and imaging applications.
Contents:
Preface
1. Introduction
2. RGB interferometry of smooth surfaces: theoretical background: 2.1. Interference fringe equations; 2.2. Interferogram analysis techniques; 2.3. Temporal phase-shifting technique; 2.4. Measurement of step-height
3. RGB interferometry of rough surfaces: theoretical background: 3.1. Single-wavelength speckle techniques; 3.2. Measurement of deformation; 3.3. Measurement of shape and deformation simultaneously
4. Sensors for RGB interferometry: Bayer 1CCD and prism-based 3CCD sensors
5. RGB interferometry systems and their applications: 5.1. Surface profiling of continuous surfaces; 5.2. Surface profiling of discontinuous surfaces; 5.3. Surface profiling of biological tissues; 5.4. Simultaneous measurement of deformation and shape on rough surfaces; 5.5. Surface profiling of smooth and rough surfaces simultaneously; 5.6. Measurement of large defects for NDT applications
6. Color cross-talk and its influence in RGB interferometry
7. Conclusions
References.
Notes:
"SPIE Digital Library."--Website.
Includes bibliographical references.
Title from PDF title page (SPIE eBooks Website, viewed 2020-01-28).
ISBN:
9781510634350
9781510634367
9781510634374
OCLC:
1139150992
Access Restriction:
Restricted for use by site license.

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