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Interferometry XI : techniques and analysis, 8-10 July 2002, Seattle USA
- Format:
- Book
- Series:
- SPIE proceedings series Interferometry XI
- Language:
- English
- Subjects (All):
- Interferometry--Congresses.
- Interferometry.
- Metrology--Congresses.
- Metrology.
- Other Title:
- Interferometry XI
- Place of Publication:
- [Place of publication not identified] SPIE 2002
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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