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Nondestructive evaluation and reliability of micro- and nanomaterial systems : NDE for health monitoring and diagnostics : 17-21 March 2002, San Diego, California, United States / editors, Norbert Meyendorf, George Y. Baaklini, Bernd Michel ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 4703.
- Proceedings of SPIE ; Volume 4703
- Language:
- English
- Subjects (All):
- Nanostructured materials--Testing--Congresses.
- Nanostructured materials.
- Physical Description:
- 1 online resource (228 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 2002.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 24, 2018).
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