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Machine vision and three-dimensional imaging systems for inspection and metrology II : 29-30 October 2001, Boston, [Massachusetts] USA
- Format:
- Book
- Series:
- SPIE proceedings series Machine vision and three-dimensional imaging systems for inspection and metrology II
- Language:
- English
- Subjects (All):
- Computer vision--Industrial applications--Congresses.
- Computer vision.
- Computer vision--Optical methods--Congresses.
- Three-dimensional display systems--Congresses.
- Three-dimensional display systems.
- Quality control--Congresses.
- Quality control.
- Metrology--Congresses.
- Metrology.
- Place of Publication:
- [Place of publication not identified] SPIE 2002
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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