1 option
Scanning microscopies 2013 : advanced microscopy technologies for defense, homeland security, forensic, life, environmental, and industrial sciences, 30 April-1 May 2013, Baltimore, Maryland, United States / Michael T. Postek [and three others], editors ; sponsored and published by SPIE.
- Format:
- Book
- Language:
- English
- Subjects (All):
- Scanning electron microscopes--Congresses.
- Scanning electron microscopes.
- Other Title:
- Scanning Microscopies 2013
- Place of Publication:
- SPIE
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