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Optical metrology and inspection for industrial applications II : 5-7 November 2012, Beijing, China / Kevin G. Harding, Peisen S. Huang, Toru Yoshizawa, editors ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; 0277-786X. Volume 8563.
- Proceedings of SPIE ; Volume 8563
- Language:
- English
- Subjects (All):
- Engineering inspection--Congresses.
- Engineering inspection.
- Optical detectors--Industrial applications--Congresses.
- Optical detectors.
- Physical Description:
- 1 online resource (340 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 2012.
- Notes:
- Description based on: online resource; title from pdf title page (SPIE Digital Library, viewed November 26, 2018).
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