1 option
X-ray free-electron lasers : beam diagnostics, beamline instrumentation, and applications : 13-16 August 2012, San Diego, California, United States / Stefan P. Moeller, Makina Yabashi, Stefan P. Hau-Riege, editors ; sponsored and published by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; 0277-786X. Volume 8504.
- Proceedings of SPIE ; Volume 8504
- Language:
- English
- Subjects (All):
- Free electron lasers--Congresses.
- Free electron lasers.
- Beam optics--Congresses.
- Beam optics.
- Physical Description:
- 1 online resource (210 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 2012.
- Notes:
- Description based on: online resource; title from pdf title page (SPIE Digital Library, viewed December 15, 2018).
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.