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Industrial optical sensors for metrology and inspection : 31 October-1 November 1994, Boston, Massachusetts
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Industrial optical sensors for metrology and inspection
- Language:
- English
- Subjects (All):
- Engineering inspection--Congresses.
- Engineering inspection.
- Optical detectors--Industrial applications--Congresses.
- Optical detectors.
- Optical measurements--Congresses.
- Optical measurements.
- Interferometry--Congresses--Industrial applications.
- Interferometry.
- Quality control--Optical methods--Congresses.
- Quality control.
- Place of Publication:
- [Place of publication not identified] SPIE 1995
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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