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Imaging and illumination for metrology and inspection : 2-4 November 1994, Boston, Massachusetts
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Imaging and illumination for metrology and inspection
- Language:
- English
- Subjects (All):
- Computer vision--Congresses.
- Computer vision.
- Optical detectors--Congresses.
- Optical detectors.
- Interferometry--Congresses.
- Interferometry.
- Three-dimensional imaging--Congresses.
- Three-dimensional imaging.
- Place of Publication:
- [Place of publication not identified] SPIE 1995
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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