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Testing, reliability, and application of micro- and nano-material systems II : 15-17 March, 2004, San Diego, California, USA
- Format:
- Book
- Series:
- SPIE proceedings series Testing, reliability, and application of micro- and nano-material systems II
- Language:
- English
- Subjects (All):
- Electrooptical devices--Materials--Testing--Congresses.
- Electrooptical devices.
- Photonics--Materials--Testing--Congresses.
- Photonics.
- Nanostructured materials--Testing--Congresses.
- Nanostructured materials.
- Microelectromechanical systems--Testing--Congresses.
- Microelectromechanical systems.
- Place of Publication:
- [Place of publication not identified] SPIE 2004
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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