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Optical inspection and testing : a critical review : applications in optical science and engineering : 16 November 1992, Boston, MA, United States / editor, James D. Trolinger ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 10268.
- Proceedings of SPIE ; Volume 10268
- Language:
- English
- Subjects (All):
- Optical detectors--Industrial applications--Congresses.
- Optical detectors.
- Quality control--Optical methods--Congresses.
- Quality control.
- Physical Description:
- 1 online resource (127 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1992.
- Notes:
- Description based on: online resource; title from pdf title page (SPIE Digital Library, viewed November 24, 2018).
- ISBN:
- 1-5106-1026-X
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