1 option
Automated visual inspection and machine vision II : 29 June 2017, Munich, Germany / Jürgen Beyerer, Fernando Puente León, editors ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; 1996-756X. Volume 10334.
- Proceedings of SPIE ; Volume 10334
- Language:
- English
- Subjects (All):
- Computer vision--Congresses.
- Computer vision.
- Genre:
- Conference papers and proceedings.
- Physical Description:
- 1 online resource (330 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 2017.
- Notes:
- Description based on: online resource; title from pdf title page (SPIE Digital Library, viewed October 18, 2018).
- ISBN:
- 1-5106-1114-2
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