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Sixth International Symposium on Precision Engineering Measurements and Instrumentation : 8-11 August 2010, Hangzhou, China / Jiubin Tan, Xianfang Wen, editors ; sponsored by International Committee on Measurements and Instrumentation ... [et al.] ; organized by International Committee on Measurements and Instrumentation, Instrumentation Committee of CSM (China), Harbin Institute of Technology ; cooperating organizations, China Jiliang University (China), Hefei University of Technology (China), SPIE.

SPIE Digital Library Proceedings Available online

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Format:
Book
Conference/Event
Contributor:
Hefei gong ye da xue.
International Committee on Measurements and Instrumentation.
SPIE (Society)
Ha'erbin gong ye da xue.
Zhongguo ji liang ce shi xue hui. Instrumentation Committee.
Zhongguo ji liang da xue.
Tan, J. (Jiubin)
Wen, Xianfang.
Conference Name:
International Symposium on Precision Engineering Measurements and Instrumentation (6th : 2010 : Hangzhou, China)
Language:
English
Subjects (All):
Optical measurements--Congresses.
Optical measurements.
Physical measurements--Congresses.
Physical measurements.
Measurement--Congresses.
Measurement.
Laser interferometers--Congresses.
Laser interferometers.
Place of Publication:
SPIE

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