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Second International Conference on Photomechanics and Speckle Metrology : 21 July 1991, San Diego, California, United States / editors, Fu-Pen Chiang ; sponsored by SPIE.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Conference on Photomechanics and Speckle Metrology (2nd : 1991 : San Diego, Calif.)
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 1554.
- Proceedings of SPIE ; Volume 1554
- Language:
- English
- Subjects (All):
- Speckle metrology--Congresses.
- Speckle metrology.
- Photoelasticity--Congresses.
- Photoelasticity.
- Nondestructive testing--Congresses.
- Nondestructive testing.
- Physical Description:
- 1 online resource (936 pages).
- Other Title:
- Speckle techniques, birefringence methods, and applications to solid mechanics.
- Place of Publication:
- Bellingham, Washington : SPIE, 1991.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 6, 2018).
- ISBN:
- 0-8194-0682-1
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