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Machine vision systems for inspection and metrology VII : 4-5 November, 1998, Boston, Massachusetts
- Format:
- Book
- Series:
- Proceedings of SPIE Machine vision systems for inspection and metrology VII
- Language:
- English
- Subjects (All):
- Computer vision--Congresses.
- Computer vision.
- Engineering inspection--Automation--Congresses.
- Engineering inspection.
- Optical measurements--Congresses.
- Optical measurements.
- Computer vision--Industrial applications--Congresses.
- Place of Publication:
- [Place of publication not identified] SPIE 1998
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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