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Microelectronic manufacturing yield, reliability, and failure analysis IV : 23-24 September, 1998, Santa Clara, California
- Format:
- Book
- Series:
- SPIE proceedings series Microelectronic manufacturing yield, reliability, and failure analysis IV
- Language:
- English
- Subjects (All):
- Microelectronics--Very large scale integration--Congresses.
- Microelectronics.
- Integrated circuits--Reliability--Congresses.
- Integrated circuits.
- Integrated circuits--Defects--Congresses.
- Integrated circuits--Testing--Congresses.
- Integrated circuits--Congresses.
- Place of Publication:
- [Place of publication not identified] SPIE 1998
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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