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Process control and sensors for manufacturing II : nondestructive evaluation techniques for aging infrastructures and manufacturing : 3-5 March 1999, Newport Beach, CA, United States / editor, David M. Pepper ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 3589.
- Proceedings of SPIE ; Volume 3589
- Language:
- English
- Subjects (All):
- Process control--Automation--Congresses.
- Process control.
- Detectors--Industrial applications--Congresses.
- Detectors.
- Physical Description:
- 1 online resource (viii, 180 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1999.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 3, 2018).
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