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Laser metrology and inspection : 14-18 June 1999, Munich, Germany / editor, Hans J. Tiziani, Pramod Kumar Rastogi ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 3823.
- Proceedings of SPIE ; Volume 1043
- Language:
- English
- Subjects (All):
- Lasers--Industrial applications--Congresses.
- Lasers.
- Measurement--Congresses.
- Measurement.
- Engineering inspection--Congresses.
- Engineering inspection.
- Physical Description:
- 1 online resource (298 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1999.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed November 15, 2018).
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