Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado

Format:

Book

Contributor:

Podio, Fernando L, Contributor.

Society of Photo Optical Instrumentation Engineers, Content Provider.

Society of Photo-optical Instrumentation Engineers, Content Provider.

International Disk Drive Equipment and Materials Association, Content Provider.

Series:

SPIE proceedings series Recent advances in metrology, characterization, and standards for optical digital data disks

Language:

English

Subjects (All):

Optical storage devices--Testing--Congresses.

Optical storage devices.

Optical disks--Standards--Congresses.

Optical disks.

Optical disks--Testing--Congresses.

Place of Publication:

[Place of publication not identified] SPIE 1999

Language Note:

English

Notes:

Bibliographic Level Mode of Issuance: Monograph