1 option
Three-dimensional imaging and laser-based systems for metrology and inspection III : 14-15 October, 1997, Pittsburgh, Pennsylvania
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Three-dimensional imaging and laser-based systems for metrology and inspection III
- Language:
- English
- Subjects (All):
- Three-dimensional display systems--Congresses.
- Three-dimensional display systems.
- Lasers--Congresses.
- Lasers.
- Measurement--Congresses.
- Measurement.
- Triangulation--Congresses.
- Triangulation.
- Engineering inspection--Congresses.
- Engineering inspection.
- Place of Publication:
- [Place of publication not identified] SPIE 1997
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
The Penn Libraries is committed to describing library materials using current, accurate, and responsible language. If you discover outdated or inaccurate language, please fill out this feedback form to report it and suggest alternative language.