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Thermosense XX : 13-17 April 1998, Orlando, Florida, United States / editors, John R. Snell, Richard Norman Wurzbach ; sponsored by SPIE.
- Format:
- Book
- Conference/Event
- Conference Name:
- International Conference on Thermal Sensing and Imaging Diagnostic Applications (20th : 1998 : Orlando, Fla.)
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 3361.
- Proceedings of SPIE ; Volume 3361
- Language:
- English
- Subjects (All):
- Thermography--Congresses.
- Thermography.
- Nondestructive testing--Congresses.
- Nondestructive testing.
- Physical Description:
- 1 online resource (366 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1998.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 12, 2018).
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