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Machine vision applications in industrial inspection VI : 27 January 1998, San Jose, California

SPIE Digital Library Proceedings Available online

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Format:
Book
Contributor:
Chang, Ning-San, Contributor.
Ravishankar Rao, A., Contributor.
IS & T--the Society for Imaging Science and Technology, Content Provider.
Society of Photo-Optical Instrumentation Engineers, Content Provider.
Series:
SPIE proceedings series Machine vision applications in industrial inspection VI
Language:
English
Subjects (All):
Engineering inspection--Automation--Congresses.
Engineering inspection.
Computer vision--Industrial applications--Congresses.
Computer vision.
Quality control--Optical methods--Automation--Congresses.
Quality control.
Place of Publication:
[Place of publication not identified] SPIE 1998
Language Note:
English
Contents:
Automatic blemish detection in liquid crystal flat panel displays / W.K. Pratt, S.S. Sawkar, K. O'Reilly
Automated optical inspection technology for HDD head suspension / S. Sakai, H. Oka, M. Ando
Machine vision system applied to the characterization of a powder stream : application to the laser cladding process / F. Meriaudeau ... [et al.]
Comparison of several artificial neural network classifiers for CT images of hardwood logs / D.L. Schmoldt, J. He, A.L. Abbott
Fuzzy logic connectivity in semiconductor defect clustering / T.P. Karnowski, S.S. Gleason, K.W. Tobin, Jr.
New algorithm to calculate the center of laser reflections / D. Yang ... [et al.]
Development of high-speed 3D inspection system for solder bumps / Y. Nishiyama ... [et al.]
Detection of small or low-contrast defects in web inspection / J. Laitinen
Automated detection of Karnal bunt teliospores / K.D. Linder ... [et al.]
Rule-based inspection of printed green ceramic tape / D.R. Patek ... [et al.]
Shift-, rotation-, and scale-invariant shape recognition system using an optical Hough transform / V. Schmid, G. Bader, E.H. Lueder
High-speed optoelectric image processing unit for industrial inspection / G. Cheng .. [et al.]
Adaption of the fuzzy k-nearest neighbor classifier for manufacturing automation / K.W. Tobin, Jr., S.S. Gleason, T.P. Karnowski
Representing the object model for automatic visual inspection using a description language / R. Sablatnig, C. Menard
Optoelectronic morphological processor for industrial online inspection / H. Liu ... [et al.]
Machine vision system for inner-wall surface inspection / B.H. Zhuang, W.W. Zhang.
Notes:
Bibliographic Level Mode of Issuance: Monograph

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