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Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering; 730
- Proceedings of SPIE--the International Society for Optical Engineering Automated inspection and measurement
- Language:
- English
- Subjects (All):
- Engineering inspection--Automation--Congresses.
- Engineering inspection.
- Optical measurements--Congresses.
- Optical measurements.
- Quality control--Optical methods--Congresses.
- Quality control.
- Physical Description:
- 1 online resource (vi, 256 pages) : illustrations.
- Place of Publication:
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1987
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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