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Spectroscopic characterization techniques for semiconductor technology II : 1985 Los Angeles technical symposium : 21-25 January 1985, Los Angeles, United States / editors, Fred H. Pollak, Raphael Tsu ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 0524.
- Proceedings of SPIE ; Volume 0524
- Language:
- English
- Subjects (All):
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Spectrum analysis--Congresses.
- Spectrum analysis.
- Physical Description:
- 1 online resource (vi, 169 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1985.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 10, 2018).
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