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Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Symposium on Laser Metrology, Corporate Author.
- Conference Name:
- International Symposium on Laser Metrology (8th : 2005 : Merida, Yucatan, Mexico)
- International Symposium on Laser Metrology
- Series:
- Proceedings of SPIE Eighth International Symposium on Laser Metrology
- Language:
- English
- Subjects (All):
- Lasers--Industrial applications--Congresses.
- Lasers.
- Laser interferometers--Industrial applications--Congresses.
- Laser interferometers.
- Measurement--Congresses.
- Measurement.
- Optical measurements--Congresses.
- Optical measurements.
- Place of Publication:
- [Place of publication not identified] SPIE 2005
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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