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Advances in Metrology for X-Ray and EUV Optics. VIII : 11-12 August 2019, San Diego, California, United States / Lahsen Assoufid, Haruhiko Ohashi, Anand Asundi.
- Format:
- Book
- Author/Creator:
- Assoufid, Lahsen, author.
- Ohashi, Haruhiko, author.
- Asundi, Anand, author.
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering.
- Proceedings of SPIE--the International Society for Optical Engineering
- Language:
- English
- Subjects (All):
- Optical materials--Congresses.
- Optical materials.
- Physical Description:
- 1 online resource (1 volume) : illustrations.
- Place of Publication:
- Bellingham, Washington : SPIE, 2019.
- Notes:
- Description based on publisher supplied metadata and other sources.
- ISBN:
- 1-5106-2912-2
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