Optical metrology and inspection for industrial applications : 18-20 October 2010

Format:

Book

Contributor:

Harding, Kevin G., Contributor.

Yoshizawa, Tåoru, Contributor.

Huang, Peisen S., Contributor.

Yoshizawa, Toru, Contributor.

China, Content Provider.

Zhongguo ke xue ji shu xie hui, Content Provider.

Zhongguo guang xue xue hui, Content Provider.

Guo jia zi ran ke xue ji jin wei yuan hui (China), Content Provider.

Series:

Proceedings of SPIE Optical metrology and inspection for industrial applications

Language:

English

Subjects (All):

Engineering inspection--Industrial applications--Congresses.

Engineering inspection.

Optical detectors--Industrial applications--Congresses.

Optical detectors.

Optical measurements--Optical methods--Congresses.

Optical measurements.

Interferometry--Congresses.

Interferometry.

Quality control--Congresses.

Quality control.

Place of Publication:

[Place of publication not identified] SPIE 2010

Language Note:

English

Notes:

Bibliographic Level Mode of Issuance: Monograph