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SAR image analysis, modeling, and techniques X : 21-23 September 2010, Toulouse, France
- Format:
- Book
- Series:
- Proceedings of SPIE SAR image analysis, modeling, and techniques X
- Language:
- English
- Subjects (All):
- Synthetic aperture radar--Image quality--Congresses.
- Synthetic aperture radar.
- Synthetic aperture radar--Congresses.
- Infrared imaging--Congresses.
- Infrared imaging.
- Interferometry--Congresses.
- Interferometry.
- Remote sensing--Congresses.
- Remote sensing.
- Place of Publication:
- [Place of publication not identified] SPIE 2010
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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