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Optical test and measurement technology and equipment : 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies : 8-12 July 2007, Chengdu, China

SPIE Digital Library Proceedings Available online

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Format:
Book
Conference/Event
Author/Creator:
International Symposium on Advanced Optical Manufacturing and Testing Technologies, Corporate Author.
Contributor:
Pan, Junhua, Contributor.
Wyant, James C., Contributor.
Wang, Hexin., Contributor.
China, Content Provider.
Zhongguo ke xue yuan, Content Provider.
Zhongguo guang xue xue hui, Content Provider.
Conference Name:
International Symposium on Advanced Optical Manufacturing and Testing Technologies
Series:
Proceedings of SPIE Optical test and measurement technology and equipment
Language:
English
Subjects (All):
Optical materials--Testing--Congresses.
Optical materials.
Optical measurements--Congresses.
Optical measurements.
Measurement--Congresses.
Measurement.
Place of Publication:
[Place of publication not identified] SPIE 2007
Language Note:
English
Notes:
Bibliographic Level Mode of Issuance: Monograph

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