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X rays in materials analysis II : novel applications and recent developments : 25-26 July 1991, San Diego, California
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering X rays in materials analysis II
- Language:
- English
- Subjects (All):
- Nondestructive testing--Testing--Congresses.
- Nondestructive testing.
- X-ray spectroscopy--Congresses.
- X-ray spectroscopy.
- Materials--Congresses.
- Materials.
- Other Title:
- X Rays in Materials Analysis II
- Place of Publication:
- [Place of publication not identified] SPIE 1991
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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