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Scattering and surface roughness III : 1-2 August 2000, San Diego, USA
- Format:
- Book
- Series:
- SPIE proceedings series Scattering and surface roughness III
- Language:
- English
- Subjects (All):
- Surface roughness--Measurement--Congresses.
- Surface roughness.
- Light--Scattering--Congresses.
- Light.
- Electromagnetic waves--Scattering--Congresses.
- Electromagnetic waves.
- Place of Publication:
- [Place of publication not identified] SPIE 2000
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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