Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

Format:

Book

Contributor:

Tobin, Kenneth W, Contributor.

Society of Photo-optical Instrumentation Engineers, Content Provider.

IS & T the Society for Imaging Science and Technology, Content Provider.

Society of Photo Optical Instrumentation Engineers, Content Provider.

IS & T--the Society for Imaging Science and Technology, Content Provider.

Series:

SPIE proceedings series Machine vision applications in industrial inspection VIII

Language:

English

Subjects (All):

Engineering inspection--Automation--Congresses.

Engineering inspection.

Computer vision--Industrial applications--Congresses.

Computer vision.

Quality control--Automation--Optical methods--Congresses.

Quality control.

Measurement--Congresses.

Measurement.

Place of Publication:

[Place of publication not identified] SPIE 2000

Language Note:

English

Notes:

Bibliographic Level Mode of Issuance: Monograph