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Surface characterization and testing II : 10-11 August 1989, San Diego, California
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Surface characterization and testing II
- Language:
- English
- Subjects (All):
- Surfaces (Technology)--Congresses--Testing.
- Surfaces (Technology).
- Surfaces (Technology)--Congresses--Optical properties.
- Place of Publication:
- [Place of publication not identified] SPIE the International Society for Optical Engineering 1989
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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