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Fringe pattern analysis : 8-9 August 1989, San Diego, California
- Format:
- Book
- Conference/Event
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Fringe pattern analysis
- Language:
- English
- Subjects (All):
- Diffraction patterns--Congresses.
- Diffraction patterns.
- Interferometry--Congresses.
- Interferometry.
- Image processing--Congresses.
- Image processing.
- Place of Publication:
- [Place of publication not identified] SPIE 1989
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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