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Tests, measurements, and characterization of electro-optic devices and systems : 5-7 September 1989, Boston, Massachusetts, United States / editor, Shekhar G. Wadekar ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 1180.
- Proceedings of SPIE ; Volume 1180
- Language:
- English
- Subjects (All):
- Electrooptical devices--Congresses.
- Electrooptical devices.
- Electrooptics--Congresses.
- Electrooptics.
- Physical Description:
- 1 online resource (196 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1989.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 12, 2018).
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