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Test and evaluation of infrared detectors and arrays : 27-31 March 1989, Orlando, Florida, United States / editor, Forney M. Hoke ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 1108.
- Proceedings of SPIE ; Volume 1108
- Language:
- English
- Subjects (All):
- Infrared detectors--Testing--Congresses.
- Infrared detectors.
- Array processors--Testing--Congresses.
- Array processors.
- Infrared technology--Congresses.
- Infrared technology.
- Physical Description:
- 1 online resource (306 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1989.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 12, 2018).
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