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Three-dimensional imaging and laser-based systems for metrology and inspection II : 20-21 November, 1996, Boston, Massachusetts
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Three-dimensional imaging and laser-based systems for metrology and inspection II
- Language:
- English
- Subjects (All):
- Three-dimensional imaging--Congresses.
- Three-dimensional imaging.
- Lasers--Congresses.
- Lasers.
- Optical measurements--Congresses.
- Optical measurements.
- Moiré topography--Congresses.
- Moiré topography.
- Engineering inspection--Congresses.
- Engineering inspection.
- Place of Publication:
- [Place of publication not identified] SPIE 1996
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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