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Polarization analysis and applications to device technology : International Symposium on Polarization Analysis and Applications to Device Technology : 12-14 June, 1996, Yokahama, Japan
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Symposium on Polarization Analysis and Applications to Device Technology, Corporate Author.
- Conference Name:
- International Symposium on Polarization Analysis and Applications to Device Technology (1996 : Yokahama, Japan)
- International Symposium on Polarization Analysis and Applications to Device Technology
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Polarization analysis and applications to device technology
- Language:
- English
- Subjects (All):
- Electrooptical devices--Congresses.
- Electrooptical devices.
- Polarizers (Light)--Congresses.
- Polarizers (Light).
- Optoelectronic devices--Congresses.
- Optoelectronic devices.
- Polarimetry--Congresses.
- Polarimetry.
- Electrooptics--Congresses.
- Electrooptics.
- Refraction, Double--Congresses.
- Refraction, Double.
- Place of Publication:
- [Place of publication not identified] SPIE 1996
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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