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Optical inspection and micromeasurements : 10-14 June 1996, Besançon, France
- Format:
- Book
- Series:
- SPIE proceedings series Optical inspection and micromeasurements
- Language:
- English
- Subjects (All):
- Engineering inspection--Congresses--Industrial applications.
- Engineering inspection.
- Optical measurements--Industrial applications--Congresses.
- Optical measurements.
- Optical detectors--Industrial applications--Congresses.
- Optical detectors.
- Interferometry--Congresses.
- Interferometry.
- Place of Publication:
- [Place of publication not identified] SPIE International Society for Optical Engineering 1996
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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