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Noise in devices and circuits : 2-4 June, 2003, Santa Fe, New Mexico, USA
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering Noise in devices and circuits
- Language:
- English
- Subjects (All):
- Electronic circuits--Noise--Congresses.
- Electronic noise--Noise--Congresses.
- Electric circuits--Congresses.
- Electric noise--Congresses.
- Place of Publication:
- [Place of publication not identified] SPIE 2003
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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