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International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics : [proceedings] 11-13 May, 1995, Kiev, Ukraine
- Format:
- Book
- Conference/Event
- Author/Creator:
- International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, Corporate Author.
- Conference Name:
- International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics (1995 : Kiev, Ukraine)
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics
- Language:
- English
- Subjects (All):
- Electronics--Optical properties--Congresses--Materials.
- Electronics.
- Electronics--Materials--Congresses--Testing.
- Optoelectronics--Materials--Optical properties--Congresses.
- Optoelectronics.
- Microelectronics--Congresses--Materials--Optical properties.
- Microelectronics.
- Quantum electronics--Optical properties--Materials--Congresses.
- Quantum electronics.
- Place of Publication:
- [Place of publication not identified] SPIE 1995
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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