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X-ray multilayers for diffractometers, monochromators, and spectrometers : 17-19 August 1988, San Diego, California
- Format:
- Book
- Series:
- Proceedings / SPIE--the International Society for Optical Engineering X-ray multilayers for diffractometers, monochromators, and spectrometers
- Language:
- English
- Subjects (All):
- Thin films, Multilayered--Congresses.
- Thin films, Multilayered.
- X-rays--Congresses.
- X-rays.
- Monochromator--Surfaces--Congresses.
- Monochromator.
- Spectrometer--Congresses--Surfaces.
- Spectrometer.
- X-ray diffractometer--Congresses--Surfaces.
- X-ray diffractometer.
- Place of Publication:
- [Place of publication not identified] The Society 1988
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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