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Spectroscopic characterization techniques for semiconductor technology III : advances in semiconductors and superconductors : physics and device applications : 14-18 March 1988, Newport Beach, CA, United States / editors, Orest J. Glembocki, Fred H. Pollak, Fernando A. Ponce ; sponsored by SPIE.
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering ; Volume 0946.
- Proceedings of SPIE ; Volume 0946
- Language:
- English
- Subjects (All):
- Semiconductors--Testing--Congresses.
- Semiconductors.
- Spectrum analysis--Congresses.
- Spectrum analysis.
- Physical Description:
- 1 online resource (707 pages).
- Place of Publication:
- Bellingham, Washington : SPIE, 1988.
- Notes:
- Description based on: online resource; title from title screen (SPIE Digital Library, viewed December 10, 2018).
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