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Automated inspection and high speed vision architectures : 3-4 November, 1987, Cambridge, Massachusetts / 3-4 November, 1987, Cambridge, Massachusetts / $c Michael J.W. Chen, Rolf-Juergen Ahlers, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering, in association with IEEE Industrial Electronics Society, Society of Instrument and Control Engineers of Japan ; cooperating organizations, Center for Optical Data Processing/Carnegie Mellon University [et al.].
- Format:
- Book
- Series:
- Proceedings of SPIE--the International Society for Optical Engineering 849
- Proceedings of SPIE--the International Society for Optical Engineering Automated inspection and high speed vision architectures
- Language:
- English
- Subjects (All):
- Quality control--Optical methods--Automation--Congresses.
- Quality control.
- Computer vision--Congresses.
- Computer vision.
- Physical Description:
- 1 online resource (vi, 274 pages) : illustrations.
- Place of Publication:
- Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1988
- Language Note:
- English
- Notes:
- Bibliographic Level Mode of Issuance: Monograph
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